Critical Dimensional Measurement Systems Seeing and measuring the impossible

VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

A compact, high-accuracy dimensional measurement system 

High Performance Floor Model Optical Metrology System 

Exceptional value in a high-accuracy dimensional measurement system 

Extra large format dimensional metrology system
A high throughput, high-accuracy dimensional metrology system
Elevates Pinnacle performance to the next level
A large travel, high-accuracy dimensional measurement system
Offers exceptional linewidth and overlay measurement capability
A compact, high-accuracy dimensional measurement system

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study