high-performance critical dimensional measurement system.

The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.

MicroLine systems feature the highest quality microscope optics, motorized autofocus, motorized stages, and fully programmable illumination and measurement recipes. Reflected illumination is standard and transmitted illumination is available as an option. MicroLine systems are capable of measuring bright and dark lines, semi-transparent layers, lines with irregular edges and other critical features.

Standard
Optional
XYZ Travel

MicroLine 1000 100 x 100 x 175 mm
MicroLine 2000 200 x 200 x 175 mm
MicroLine 3000 300 x 300 x 145 mm

Metrology Camera
2.0 megapixel, digital, B&W metrology camera
1.4 megapixel, 2/3 inch, digital, monochrome Color and other camera configurations available upon request
XY Stage
Cross roller with manual coaxial positioning and quick release; Glass stage insert for use with transmitted light
Objective Lenses (Field Interchangable)
10X Bright Field 50X Bright Field

5X BF or BF/DF
10X BF or BF/DF
20X LWD, BF or BF/DF
100X LWD, BF or BF/DF
150X LWD, BF or BF/DF

Imaging Optics

Olympus Microscope optics, including horizontal bright field/dark field illuminator, five-objective manual lens turret with DIC slot, tilt trinocular viewing system with optical crosshair, and standard 0.63X back tube with camera mount

Illumination
Green LED coaxial surface light and LED transmitted substage light, programmable for source and intensity
White LED coaxial surface light and color filters
FEATURES

The MicroLine systems are well suited to measure wafers, masks, MEMS, and other micro-fabricated parts. These capable desktop instruments provide precise optical measurement for features as small as 0.5 microns on parts up to 300 x 300 mm. With its advanced lighting and optics, the MicroLine boasts robust capabilities for measuring transparent layers, lines with irregular edges, and more.

The MicroLine operates with VMS, VIEW’s flagship metrology software:

SUPPORT
info@viewmm.com

For system support status, please refer to:

Product Support Matrix

Application Study Performed on Your Parts

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