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Key Technologies

Critical Dimensional Measurement Systems imaging and measuring the impossible

Optical Metrology Systems

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VIEW systems are designed for measurement of parts and assemblies with complex dimensions and a high density of features. They include the most advanced QVI technologies for high accuracy, repeatability, and throughput.
Mechanical Design | Optics | Sensor Integration | Software

Area Multi-Focus Imaging (AMF)

Advanced video analysis technique that uses video and turns it into a 3D image

Continuous Image Capture (CiC)

Exclusive CiC technique can map a large surface area, stitching together

Digital Megapixel Cameras

Attribute inspection applications, true color processing is now possible

Focus Grid Measurement

Projecting a grid of lines onto the part surface to determine the optimum focus

Illumination Measurement

Each measurement may be programmed to best illuminate the feature of interest

Integrated Laser Options

Support a variety of laser sensors for height / depth and surface profile measurements

Mechanical Design

Robust platforms providing structural integrity, thermal stability and vibration isolation

MicroTheta Rotary

Inspect a surface of a part, and then inspect another surface of the part

Optics

A choice of optical systems to best suit the measurement application at hand

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study