VIEW offers a full line of optical metrology systems and software for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements. Designed for measurement of parts and assemblies with complex dimensions and a high density of features, VIEW solutions utilize the most advanced QVI technologies for high accuracy, repeatability, and throughput.
A full line of metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component systems.
Metrology systems vary significantly in their utility, which is largely a function of software. View’s software provides unique capabilities for productivity, automation, integration, and customization.
Designed for measurement of parts and assemblies with complex dimensions and features.
No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution.