Critical Dimensional Measurement Systems That Can See and Measure the Impossible

VIEW offers a full line of optical metrology systems for wafer, MEMS, photomasks, sliders, semiconductor packaging, fan-out, HDD suspensions, probe cards, wire-bonding, and other micro-component process measurements.

Large area, high-accuracy dimensional metrology system.  High-speed linear motor drives, single or dual magnification fixed lens optics. Suited for measuring large footprint parts such as PCBs, stencils, flat panel displays, etching sheets, and mask patterns, as well as nested groups of smaller parts.

High Throughput, High-Accuracy Dimensional Metrology System featuring high-speed linear motor drives and single or dual magnification fixed lens optical system.  Designed for high-volume operation in production environments ranging from cleanrooms to factory floors

Ultra-High Accuracy Dimensional Metrology System featuring high-speed linear motor drives, single magnification fixed optics, and high-performance Z-axis motion assembly.  Designed for high-volume operation in production environments ranging from cleanrooms to factory floors.

High-Accuracy Benchtop Dimensional Metrology System.  DC servo motor stage drives and single or dual magnification fixed lens optics.

High-Accuracy Floor Model Dimensional Metrology System.  DC servo motor stage drives and single or dual magnification fixed lens optics.

Ultra-High Accuracy Critical Dimensional Metrology System.  Combines the XYZ accuracy of linear motor drives with the ultra-high magnification optics of MicroLine® AF systems.  5-position objective lens turret.  Designed to measure wafers, masks, MEMS, and other micro-fabricated parts.

Automated Benchtop Critical Dimensional Metrology System.  Auto-focus microscope optics with 5-position objective lens turret.  Manual stage positioning.  Designed to measure wafers, masks, MEMS, and other micro-fabricated parts.

Automated Benchtop Critical Dimensional Metrology System.  Auto-focus microscope optics with 5-position objective lens turret. Designed to measure wafers, masks, MEMS, and other micro-fabricated parts.

Ask us about a high-performance VIEW measurement system application study

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