Accurate and Efficient Non-Contact Inspection in a Broad Range of Implementations

VIEW metrology solutions measure critical dimensions in a wide variety of applications involving 2D micro-components and assemblies.  Compared to “walk up and measure” routines, VIEW systems are designed for continuous operation in automated production environments, with speeds that often help metrology teams achieve 100% inspection.

Photolithography & MEMs Fabrication

VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle

Orifice diameter/position measurement accuracy of < 10 nm 

Measurement of pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations 

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Electronic Assembly Calibration & Monitoring

Metrology solutions for fiber optic interconnect components 

Measuring the true position and pitch of each lead within large multi-lead arrays 

Quickly acquire data on connector positions, size, pitch, & coplanarity measurements 

Connector Measurement

Measurement of positioning and rotation (X, Y, and Theta) relative to pads
Measuring ball, tooling mark diameters, placement, pad alignment, & wire loop height

Critical Dimensional Measurement Systems

Mobile Phone, Tablet & Wearable Assembly

Accurate and efficient non-contact inspection of fan-out wafer-level packaging with multiple levels of magnification

Versatile lighting, large-size stages, high-resolution positioning 

Coplanarity, lead width, pitch, ball diameter, package height and warpage inspection 

PCB Inspection

Measurement of critical features such as the positions of leads, pads, and warpage

A crucial height and volume measurements to new process development

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Hard Disc Drive Component Metrology

Elevates Pinnacle performance to the next level
A large travel, high-accuracy dimensional measurement system
Offers exceptional linewidth and overlay measurement capability
Offers exceptional linewidth and overlay measurement capability
A large travel, high-accuracy dimensional measurement system

Critical Dimensional Measurement Systems

Precision Micro-Grinding

Metrology system high-resolution stage motion, quality optics, autofocus capabilities
Inspection of electrical test probes requires precision metrology capabilities to accurately measure small features

Extremely high levels of three-dimensional accuracy metrology systems 

Metrology application for process control and inspection of watch components

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Custom Engineering

Application-specific fixturing, programming, interfaces to third party sensors & equipment

Integral to the inspection process with VMS 

Critical Dimensional Measurement Systems

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VMS® and Elements® Software

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VIEW Full Product Line

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