Advanced Measurement Programming Capabilities with Flexible User Interfaces

Optical Metrology Software
Not sure which product is best for you?

VIEW offers a choice of two metrology software packages to suit a wide range of measurement and process control applications.  Both packages offer high-speed image acquisition, feature analysis, flaw detection, and other versatile measurement capabilities.

 

Effectively bridges the gap between the lab and the production environment by combining high-level functionality with ease of use in one system.

Modules enable a single VIEW system to provide CAD-driven measurement of a variety of electronic assembly manufacturing steps.
 

Technical Data Sheets and Information.

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VMS® and Elements® Software

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VIEW Full Product Line

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