Wafer Level Inspection

As today’s semiconductor designs continually become smaller and denser, the challenges of wafer inspection are constantly escalating. Extremely small feature sizes can require 50X or higher objective lens magnification and highly programmable top-lighting/back-lighting, along with ultra high-resolution accuracy and repeatability.

(800) SOS-VIEW(767-8439)


For system support status, please refer to:

Product Support Matrix

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study