Field Emitter Display Fed-hole Measurement

Measure gate plate diameters as small as a micron

Manufacturing Field Emitter Displays (FEDs) and ensuring the precision and quality of their fabricated components presents a daunting challenge. One such challenge involves precisely measuring hole diameters and roundness in a FED gate plate with accuracy of ± 0.01 µm or better.

To accomplish this, the VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle. High-precision non-contact measurement in an FED production environment results in faster and more accurate measurements with a higher repeatability than a Scanning Electron Microscope (SEM).


(800) SOS-VIEW(767-8439)

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