Electrical Test Probes

The inspection of electrical test probes requires precision metrology capabilities to accurately measure small features such as the positioning, pitch, and coplanarity of test lead ends. Fast and repeatable precision inspection processes often require a combination of multiple magnifications, high-performance video auto-focus with 50X lens, and/or through-the-lens laser options for rapid Z-axis measurements.

In addition to performing these demanding dimensional measurements, the VIEW systems are also used to perform defect inspection which in this case includes the presence of a broken wire or scratches on the substrate surface.

SUPPORT

(800) SOS-VIEW(767-8439)

viewmm-service@qvii.com

For system support status, please refer to:

Product Support Matrix

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study