VIEW systems offer a choice of optical systems to best suit the measurement application at hand. VIEW Benchmark, Pinnacle and Summit systems may be configured with either the Single Magnification Fixed Lens Optics, or the unique Dual Magnification Optics system. Both of these arrangements offer optical interchangeable front objective lenses to allow the magnification and field of view size to be matched to the features being measured.

The single magnification system is simple and offers an optical resolution that is well matched to the pixel size of the 2.0 megapixel digital camera with the standard objective lenses. This system is ideal for high speed measurement of parts with many similar features, for which a single magnification is sufficient.

The dual magnification system utilizes two integral optical paths, each with its own camera. The high magnification path is a 4X multiple of the low magnification, offering an instantaneous zoom capability for higher optical resolution. This system is ideal for measurement of parts where both a wide field of view and high accuracy are desired for different features. The dual magnification system is also ideal for applications requiring best autofocus performance.

Both systems may be paired with one of several camera models –monochrome or color – that match pixel size and density with the optical resolution of the configured lens system. The range of optical and camera configurations available allows VIEW to optimize the system for the application at hand.

VIEW MicroLine systems for micro-fabricated part measurement use a semiconductor inspection microscope configured with a horizontal illuminator, multi-objective lens turret and an appropriate selection of Bright Field or Bright Field / Dark Field objectives. There are many optical and camera configurations available for the MicroLine systems, depending on the nature of parts to be measured.


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