Area Multi-Focus (AMF)

AMF™ is an advanced video analysis technique that uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image. This technique can be used to measure flatness, roughness, height, and volume. It is faster than any scanning method requiring XY stage motion.

This is yet another example of VIEW’s commitment to advancing technology for video metrology applications.

Systems need to combine accurate and repeatable measurement capabilities with high-performance auto-focus and flexible programmability.