CiC™ measurement takes “snapshots” of a part image as the part is continually moved beneath the system optics. VIEW’s exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement performance.
SUPPORT
(800) SOS-VIEW(767-8439)
viewmm-service@qvii.com
For system support status, please refer to: