Critical Dimensional Measurement Systems
seeing and measuring the impossible

Optical Metrology Applications
Not sure which product is best for you?
No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.

Data Storage

Extra large format dimensional metrology system
A high throughput, high-accuracy dimensional metrology system
Elevates Pinnacle performance to the next level
A large travel, high-accuracy dimensional measurement system
Offers exceptional linewidth and overlay measurement capability
Offers exceptional linewidth and overlay measurement capability
A large travel, high-accuracy dimensional measurement system
Offers exceptional linewidth and overlay measurement capability

Critical Dimensional Measurement Systems

Electronic Assembly

Measurement of positioning and rotation (X, Y, and Theta) relative to pads
Measurement of critical features such as the positions of leads, pads, and warpage
Measurement of pocket positioning and interior pocket and wall angles

A crucial height and volume measurements to new process development

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Critical Dimensional Measurement Systems

Inkjet Nozzle

Orifice diameter/position measurement accuracy of < 10 nm

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Micro-Elecro-Mechanical Systems (MEMS) Measurement

Measurement of pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Microelectronics

Metrology solutions for fiber optic interconnect components
Versatile lighting, large-size stages, high-resolution positioning
Die-to-pad placement/alignment, lead positions/sizes, lead tilt measurements
Measuring the true position and pitch of each lead within large multi-lead arrays
Quickly acquire data on connector positions, size, pitch, & coplanarity measurements
Measuring ball, tooling mark diameters, placement, pad alignment, & wire loop height

Precision Assembly & Fabrication

Fast measurement cycle times, sophisticated image recognition, flexible lighting capabilities

Extremely high levels of three-dimensional accuracy metrology systems 

Metrology system high-resolution stage motion, quality optics, autofocus capabilities
Metrology application for process control and inspection of watch components

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Semiconductor

accurately inspecting critical factors such as bump height, location, and coplanarity often requires advanced metrology features
Non-contact measurement on chip carriers requires advanced lighting techniques and image processing capabilities
Inspection of electrical test probes requires precision metrology capabilities to accurately measure small features
VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle
Accurate and efficient non-contact inspection of flip chips with multiple levels of magnification
Versatile optics and lighting as well as advanced edge detection and image processing capabilities
Coplanarity, lead width, pitch, ball diameter, package height and warpage inspection

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Critical Dimensional Measurement Systems

Custom Engineering

Application-specific fixturing, programming, interfaces to third party sensors & equipment

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study

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VMS® and Elements® Software

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VIEW Full Product Line

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