Critical Dimensional Measurement Systems
seeing and measuring the impossible

Optical Metrology Applications
Not sure which product is best for you?
No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.

Connector Measurement

Metrology solutions for fiber optic interconnect components
Measuring the true position and pitch of each lead within large multi-lead arrays
Quickly acquire data on connector positions, size, pitch, & coplanarity measurements

Electronic Assembly Calibration & Monitoring

Measurement of positioning and rotation (X, Y, and Theta) relative to pads
Measuring ball, tooling mark diameters, placement, pad alignment, & wire loop height

Critical Dimensional Measurement Systems

Hard Disc Drive Component Metrology

Elevates Pinnacle performance to the next level
A large travel, high-accuracy dimensional measurement system
Offers exceptional linewidth and overlay measurement capability
Offers exceptional linewidth and overlay measurement capability
A large travel, high-accuracy dimensional measurement system

Critical Dimensional Measurement Systems

Mobile Phone, Tablet & Wearable Assembly

Accurate and efficient non-contact inspection of fan-out wafer-level packaging with multiple levels of magnification
Versatile lighting, large-size stages, high-resolution positioning
Coplanarity, lead width, pitch, ball diameter, package height and warpage inspection

PCB Inspection

Measurement of critical features such as the positions of leads, pads, and warpage

A crucial height and volume measurements to new process development

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Photolithography & MEMs Fabrication

VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle
Orifice diameter/position measurement accuracy of < 10 nm
Measurement of pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations

Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Precision Micro-Grinding

Metrology system high-resolution stage motion, quality optics, autofocus capabilities
Inspection of electrical test probes requires precision metrology capabilities to accurately measure small features

Extremely high levels of three-dimensional accuracy metrology systems 

Metrology application for process control and inspection of watch components

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Custom Engineering

Application-specific fixturing, programming, interfaces to third party sensors & equipment

Critical Dimensional Measurement Systems

Critical Dimensional Measurement Systems

Application Study Performed on Your Parts

For a NO COST high-performance dimensional measurement systems application study

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VMS® and Elements® Software

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VIEW Full Product Line

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