Optical Metrology Applications
Not sure which product is best for you?
No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.
Electronic Assembly Calibration & Monitoring
Hard Disc Drive Component Metrology
Mobile Phone, Tablet & Wearable Assembly
Accurate and efficient non-contact inspection of fan-out wafer-level packaging with multiple levels of magnification
Measurement of critical features such as the positions of leads, pads, and warpage
Photolithography & MEMs Fabrication
VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle
Metrology system high-resolution stage motion, quality optics, autofocus capabilities
Inspection of electrical test probes requires precision metrology capabilities to accurately measure small features