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Micro Metrology Platforms, Measurement Software, and Unique Tools for Productivity

VIEW offers a full line of optical metrology systems and software for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements. Designed for measurement of parts and assemblies with complex dimensions and a high density of features, VIEW solutions utilize the most advanced QVI technologies for high accuracy, repeatability, and throughput.

MICRO Metrology Systems

用於晶圓、光掩模、滑塊、MEMS、半導體封裝、硬盤驅動器懸架、探針卡和微元件系統的全系列計量系統。

Metrology 軟件

計量系統的效用差異很大，這主要是軟件的功能。 View 的軟件為生產力、自動化、集成和定制提供了獨特的功能。

PROPRIETARY TECHNOLOGIES

設計用於測量具有復雜尺寸和特徵的零件和組件。

DIVERSE APPLICATIONS

無論對超高精度測量有什麼要求，VIEW都有理想的解決方案。

Ask us about a high-performance VIEW measurement system application study