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Micro Metrology Platforms, Measurement Software, and Unique Tools for Productivity

VIEW offers a full line of optical metrology systems and software for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements. Designed for measurement of parts and assemblies with complex dimensions and a high density of features, VIEW solutions utilize the most advanced QVI technologies for high accuracy, repeatability, and throughput.

MICRO Metrology Systems

用于晶圆、光掩模、滑块、MEMS、半导体封装、硬盘驱动器悬架、探针卡和微元件系统的全系列计量系统。

Metrology 软件

计量系统的效用差异很大，这主要是软件的功能。 View 的软件为生产力、自动化、集成和定制提供了独特的功能。

PROPRIETARY TECHNOLOGIES

设计用于测量具有复杂尺寸和特征的零件和组件。

DIVERSE APPLICATIONS

无论对超高精度测量有什么要求，VIEW都有理想的解决方案。

Ask us about a high-performance VIEW measurement system application study