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Optical Metrology Systems

For critical dimensional measurement VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

VIEW Vision News

Keep up to date on the latest in the industry.

The most important metrology technology news, developments and updates with insightful how too and tips. Coverage includes metrology systems hardware, software, …

CAD Software
What is AOI? Automated Optical Inspection in PCB
Dimensional Metrology Machine

Applications

VIEW systems and software are ideal for applications that require high speed, accuracy, and repeatability.

Enhance Productivity

Advanced image processing including Area MultiFocus, Strobe, and high speed image acquisition.

Catalogs & Datasheets

Technical Data Sheets and Information.

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For a NO COST high-performance dimensional measurement systems application study

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