Since our entrepreneurial beginnings in 1976, VIEW has evolved into a trusted provider of advanced metrology solutions serving the global microelectronics industry. Over the past five decades, we have remained committed to innovation, precision, and customer success, helping manufacturers meet the increasingly demanding challenges of modern electronics production.
As we commemorate this important milestone, we reflect on the people, partnerships, and technological advancements that have shaped our journey.
Interested in learning more about our history and evolution? Read our full story.
VIEW Engineering: The Origins of Automated Optical Metrology
During the 1970’s, several transformative trends drove demand for automated optical measurement technologies in the United States.
First, the widespread adoption of Computer Numerical Control (CNC) machining dramatically increased manufacturing throughput, creating a growing imbalance between production speed and inspection capacity. As factories became more automated, traditional measurement methods struggled to keep pace.
At the same time, manufacturers increasingly embraced Statistical Process Control (SPC) methodologies to monitor process stability, identify emerging trends, and nonconforming products from reaching customers. Effective implementation of SPC required measurement systems capable of delivering accurate, repeatable data at production-relevant speeds. Meanwhile, ongoing miniaturization across industries introduced increasingly complex measurement challenges. As components became smaller and tolerances more demanding, conventional contact-based measurement techniques proved inadequate.
New metrology technologies were needed to precisely measure microscopic features in emerging high-technology sectors, particularly semiconductor manufacturing.
Responding to Manufacturing’s Emerging Challenges
In 1976, Dr. Richard Alan Hubach, an American physicist, entrepreneur, and inventor, was employed by a major aerospace company in California. While evaluating manufacturing processes, he discovered that the cost of verifying the dimensional accuracy of certain aerospace components exceeded the cost of producing the components themselves.
Top logo, circa 1979. Bottom logo, circa 2000.
Recognizing the need for a fully automated, three-dimensional optical measurement solution, Hubach set out to fundamentally change the way manufacturers approached inspection and metrology.
With entrepreneurial vision, he and two engineer partners – Veeder South and Jack Sacks – founded VIEW Engineering, Inc. in Canoga Park, California, in 1976. Just one year later, the company introduced the RB-1, the world’s first automated three-axis, machine vision-based dimensional measurement system.
The Birth of Vision-Based Metrology
The RB-1 became the forerunner of modern machine vision-based Coordinate Measuring Machines (CMMs), representing a groundbreaking advancement in optical metrology. By combining automated image processing with dimensional measurement capabilities, the system introduced an entirely new approach to inspection and quality control.
The impact of RB-1 extended across aerospace and other precision manufacturing industries, where it dramatically improved measurement speed, consistency, and productivity.
The RB-1 incorporated autofocus technology for Z-axis height measurements, making it one of the earliest practical systems capable of automated three-dimensional measurement. The system utilized binary image processing, converting grayscale images into high-contrast edge maps for rapid feature analysis. VIEW Engineering also enabled direct export of metrology data into commercially available SPC software, creating a seamless connection between measurement and process control.
In 1978, Hubach further expanded VIEW Engineering’s pioneering role with the introduction of the PR-1, the industry’s first pattern recognition system designed for automated wire bonders and wafer probers serving the rapidly growing semiconductor industry.
A Disruptive Innovation
The introduction of the RB-1 in 1977 established an entirely new category of manufacturing equipment and redefined the inspection process.
Unlike traditional optical comparators or measuring microscopes, the RB-1 combined automated optical inspection, dimensional metrology, and three-dimensional measurement capabilities within a single integrated system. Rather than collecting a single measurement point at each stage position, the system could analyze hundreds or even thousands of points within a single field of view before repositioning. This capability dramatically increased throughput while reducing dependence on manual inspection methods and diode-based edge detection systems.
More importantly, VIEW Engineering created a new market segment and laid the technological foundation for modern video metrology systems. The company’s innovations helped shape the evolution of machine vision, image processing, and optical metrology for decades to come, influencing the inspection technologies that remain essential to advanced manufacturing today.
Expansion and Innovation Throughout the 1980s
Disruptive technologies often gain market momentum rapidly when they address a critical industry need. VIEW Engineering’s innovations were no exception. As the semiconductor industry expanded throughout Asia and North America, manufacturers and Outsourced Semiconductor Assembly and Test companies (OSATS) increasingly recognized the value of automated optical metrology. VIEW served these growing markets through a network of authorized sales and service representatives across the United States and Asia, helping establish the company as a global leader in vision-based measurement technology.
In 1981, VIEW Engineering relocated to a larger facility in Simi Valley, California, to support its continued growth and product development initiatives. That same year, the company introduced the VIEW 1200, a second-generation vision measurement platform offering expanded measurement capacity, improved performance, and enhanced automation capabilities.
Strategic Growth and Industry Recognition
The commercial success and technological promise of automated optical metrology soon attracted the attention of major manufacturing organizations. In 1984, automotive giant General Motors made a strategic investment in VIEW Engineering, providing additional resources to accelerate product development and expand the company’s product portfolio.
Shortly thereafter, VIEW introduced the VIEW 720, a production-floor-oriented measurement system featuring grayscale image processing technology. This advancement significantly improved edge detection performance and measurement reliability, enabling more accurate inspection of increasingly complex manufactured components.
The following year, VIEW launched the VIEW 1220, incorporating enhanced grayscale processing capabilities and one of the industry’s most innovative illumination technologies: the Programmable Ring Light.
1985: A Breakthrough in Metrology Illumination Technology
Invented by engineer Ralph Weisner and protected by patent, the Programmable Ring Light (PRL) represented a significant advancement in optical metrology. The system utilized movable paraboloidal and toroidal mirrors to create highly controllable illumination angles, providing unprecedented flexibility in highlighting critical part features.
This innovative approach enabled operators to reveal subtle surface characteristics and edge details that were often difficult or impossible to detect using conventional ring-lighting systems. The design was particularly beneficial in semiconductor packaging applications for viewing the tops of reflective metals in wire bonding and ball grid arrays. The result was a substantial improvement in measurement accuracy and reliability, particularly for complex geometries and challenging inspection applications.
Metrology Competitors Emerge
As automated optical metrology gained traction during the late 1970s and early 1980s, other innovators recognized the growing demand for highly specialized measurement technologies.
In 1979, Thomas Pelton, an experienced field metrology engineer, founded Micro-Metric, Inc. in San Jose, California. The company focused on developing ultra-precision optical metrology systems for the semiconductor, data storage, flat-panel display, and micro-manufacturing industries. Over time, Micro-Metric earned a reputation for building some of the world’s most accurate optical measurement systems for silicon wafers, magnetic recording heads, sliders, and advanced electronic assemblies.
At the same time, another future industry leader was establishing its presence on the East Coast. Under the leadership of Tarry Polidor, Optical Gaging Products (OGP), already known for innovation in dimensional measurement technologies, entered the video metrology market with the introduction of the Vidicom Qualifier 863 at the 1980 International Manufacturing Technology Show (IMTS) in Chicago.
The inventive Vidicom Qualifier 863 was a technologically ambitious system featuring full-field image processing, telecentric optics, constant working distance, and multiple magnification levels without requiring objective lens changes. The product signaled OGP’s commitment to automated video measurement and established the company as a formidable competitor in the emerging vision metrology market.
Competition among VIEW Engineering, OGP, and other innovators fueled an extraordinary pace of technological advancement throughout the 1980s and 1990s. OGP continued to expand its offerings with the introduction of the Intelligent Qualifier 2000 in 1986 and ultimately the SmartScope® multisensor platform in 1991, helping shape the future of multisensor dimensional metrology.
Together, these companies transformed automated optical measurement from a niche technology into a critical manufacturing discipline serving industries around the world.
Advancing Precision Through the 1990s
VIEW Engineering continued its rapid pace of innovation throughout the late 1980s and early 1990s with the introduction of several significant products, including the Precis 3000 large-format video measurement system in 1987 and the Bazic8 and Bazic12 platforms in 1988.
However, one of the most important milestones came in 1989 with the introduction of the Ultra8.
The Ultra8 was among the first video metrology systems capable of achieving sub-micron measurement accuracy, representing a major breakthrough for non-contact optical measurement technology. Designed for demanding precision applications, the system demonstrated that optical metrology could achieve levels of accuracy previously associated primarily with tactile measurement systems.
As semiconductor devices, data storage components, and electronic assemblies became increasingly complex, the Ultra8 helped establish optical metrology as a viable solution for the industry’s most challenging measurement applications.
VIEW further expanded its portfolio in 1993 with the launch of the Voyager Series. Featuring redesigned mechanical structures, improved optics, advanced illumination technologies, and enhanced software capabilities, Voyager systems incorporated many of the innovations originally developed for semiconductor manufacturing. The platform enabled VIEW to broaden its reach into mainstream industrial metrology applications while maintaining the high-precision performance demanded by advanced manufacturing environments.
A Series of Acquisitions
In August 1996, VIEW Engineering entered a new chapter when it was acquired by GSI Lumonics Inc., a global supplier of laser-based manufacturing systems.
GSI Lumonics itself was the result of the merger between General Scanning Inc. of Watertown, Massachusetts, and Lumonics Inc. of Kanata, Ontario. The combined organization was a recognized leader in industrial laser processing, precision manufacturing, and machine automation technologies.
Supported by the resources and global reach of GSI Lumonics, VIEW continued to expand its technology portfolio and market presence.
1999: Pinnacle Systems Introduced
A major milestone followed in 1999 with the introduction of the Pinnacle 250, a versatile and highly capable metrology platform that consolidated decades of VIEW application expertise into a single system architecture.
Designed to measure small, densely packed, and tightly toleranced components, the Pinnacle 250 quickly became a preferred solution for manufacturers across numerous industries. Applications included:
- Chip Scale Packages (CSPs)
- Semiconductor and microelectronic assemblies
- Lead frames
- Ball Grid Arrays (BGAs)
- Hard disk drive suspensions
- Inkjet printer heads
- Precision stampings
Powering the platform was VIEW Measurement Software (VMS), an advanced programming environment that introduced sophisticated automation capabilities, including variables, conditional logic, loops, branching structures, and customizable measurement routines. These features enabled manufacturers to automate complex inspection processes while improving throughput, repeatability, and measurement consistency.
The Pinnacle 250 proved so successful that it remains a cornerstone of VIEW’s product portfolio today.
Industry Consolidation and the Next Chapter
At the turn of the millennium, the optical metrology industry entered a new phase of consolidation and strategic expansion. Recognizing the growing importance of dimensional metrology across advanced manufacturing industries, Optical Gaging Products (OGP) took charge in acquisitions territory by establishing Tầm nhìn chất lượng quốc tế (QVI) in 2000 as a parent organization responsible for driving long-term growth, technology development, and acquisitions.
One of QVI’s first major strategic initiatives was the acquisition of VIEW Engineering from GSI Lumonics. The addition of VIEW significantly expanded QVI’s capabilities in high-precision metrology and semiconductor-focused measurement applications, markets where OGP’s presence had previously been limited.
Together, OGP and VIEW formed one of the industry’s most comprehensive portfolios of optical metrology solutions, spanning applications from general manufacturing inspection to advanced semiconductor and microelectronics measurement.
VIEW continued its tradition of innovation following the acquisition. In 2001, the company introduced the Summit 450 and Summit 600, large-capacity video measurement systems that combined high-speed precision stages with fixed-magnification optical architectures to deliver exceptional throughput, accuracy, and repeatability.
The Summit platform proved highly successful, and like the Pinnacle, the Summit 600, 625, and 800 series systems remain important products within VIEW’s portfolio today. This large format machine is most advantageous in large workpiece applications such as wafer die alignments, showerhead via measurement, panel level packaging, and large photomasks.
The Formation of VIEW Micro Metrology
QVI further strengthened its position in advanced metrology in 2006 when the VIEW subsidiary acquired Micro-Metric, Inc., a recognized leader in high-magnification critical-dimension metrology and nanometer-scale measurement systems serving the semiconductor, MEMS, data storage, and micro-manufacturing industries.
Micro-Metric had established a reputation for developing some of the world’s most precise optical measurement technologies. Its systems were capable of achieving field-of-view measurement accuracies as low as 5 nanometers (3σ using a 100x objective), positioning the company at the forefront of emerging nanometrology applications.
The acquisition significantly enhanced QVI’s capabilities in semiconductor and nanoscale measurement while providing Micro-Metric with expanded global sales, service, and support resources. Together, the organizations were able to accelerate product development while delivering broader solutions to customers worldwide.
To fully capitalize on the complementary strengths of both companies, QVI merged VIEW Engineering and Micro-Metric in 2007 to form VIEW Micro Metrology.
The newly formed organization combined decades of expertise in semiconductor metrology, advanced electronics inspection, machine vision, and nanometer-scale measurement technologies. The integration streamlined operations, expanded engineering resources, and created a unified platform for continued innovation in precision optical metrology.
Advancing Three-Dimensional Measurement Technology
During this period, QVI introduced a series of advanced Through-The-Lens (TTL) laser technologies that significantly expanded the three-dimensional measurement capabilities of VIEW and other QVI metrology platforms.
Unlike conventional laser measurement systems, the TTL laser shares the same optical path as the vision system’s imaging camera. Laser energy is directed through the objective lens to the surface being measured and reflected back through the same optical pathway to an integrated sensor.
This on-axis configuration enables accurate measurement of recessed features and surfaces located adjacent to steep walls or vertical structures that can be difficult to access using traditional optical measurement methods.
Beyond its measurement capabilities, the TTL laser provided rapid auto-focus performance in less than 0.5 seconds, highly accurate single-point Z-height measurements, and high-speed three-dimensional surface scanning at rates approaching 10,000 points per second.
With a laser spot size of less than 10 microns and Z-axis resolution as fine as 0.1 micron, the technology delivered exceptional measurement performance across a wide range of materials and surface conditions, including both highly reflective and matte finishes.
The introduction of TTL laser technology further extended the versatility of VIEW metrology systems, enabling manufacturers to perform comprehensive two-dimensional and three-dimensional measurements within a single integrated platform.
Asian Markets
By the late 2000s, a second major wave of semiconductor manufacturing expansion was underway across Southeast Asia and China. As global semiconductor production increasingly shifted toward Asia, manufacturers demanded advanced metrology solutions capable of supporting high-volume production and ever-shrinking device geometries.
Following the integration of VIEW Engineering and Micro-Metric, Inc., QVI strengthened its commitment to the region by establishing its own Asia Authorized Channel Partner Program in 2009. The company opened a regional VIEW Micro Metrology office in Singapore.
At the same time, QVI consolidated its U.S. operations by relocating VIEW Micro Metrology from Simi Valley, California, to the company’s Western Regional facility in Tempe, Arizona.
This expanded global footprint enabled the organization to provide stronger local sales, applications, and service support to semiconductor manufacturers throughout Asia while maintaining close relationships with customers in North America.
Focus on Specialized Semiconductor Markets
Under the leadership of Mark Glowacky and Tim Sladden in North America, and Raymond Go throughout Asia, VIEW Micro Metrology developed deep expertise in several highly specialized market segments, including:
- Outsourced Semiconductor Assembly and Test (OSAT) providers
- Hard disk drive manufacturing
- Semiconductor tooling and equipment manufacturers
- Probe card manufacturers
- Gas distribution and process equipment suppliers, including showerhead manufacturers
The Singapore operation, led by Raymond Go, successfully established relationships with many of the world’s largest semiconductor manufacturers and assembly providers, while the U.S. division continued supporting customers across diverse industries ranging from aerospace and electronics to medical device manufacturing and precision machining.
Together, these efforts reinforced VIEW Micro Metrology’s position as a global supplier of precision optical metrology solutions for advanced manufacturing environments.
The CHIPS and Science Act Era
While the 2010s were relatively quiet from a corporate perspective, significant geopolitical and economic developments were reshaping the global semiconductor industry.
For decades, semiconductor manufacturing had steadily migrated from the United States to Asia as companies sought lower production costs and government-supported manufacturing incentives. As a result, the U.S. share of global semiconductor manufacturing capacity declined from nearly 40 percent in 1990 to approximately 12 percent by the early 2020s.
This shift created concerns among policymakers, industry leaders, and national security officials. Advanced semiconductor production became increasingly concentrated in a small number of overseas manufacturing hubs, particularly Taiwan and South Korea, leaving global supply chains vulnerable to geopolitical tensions, natural disasters, and economic disruptions.
The risks became particularly apparent during the COVID-19 pandemic, when semiconductor shortages impacted industries worldwide. Supply disruptions delayed production of automobiles, consumer electronics, industrial equipment, and numerous other products, highlighting the strategic importance of resilient semiconductor supply chains.
In response, the United States enacted the CHIPS and Science Act of 2022, legislation designed to strengthen domestic semiconductor manufacturing, research, workforce development, and supply-chain security through substantial federal investment and incentives.
Establishing the VIEW Micro Metrology Center of Excellence
As semiconductor investment accelerated across the United States, QVI realigned its VIEW Micro Metrology operations to support the industry’s resurgence.
The company relocated its Tempe office to QVI’s corporate headquarters in Rochester, New York, and in late 2024 established the VIEW Micro Metrology Center of Excellence (COE). Located within New York’s rapidly expanding semiconductor ecosystem, the facility sits in the heart of the Trung tâm công nghệ NY SMART I-Corridor, often referred to as New York’s “Semiconductor Superhighway.” The region has emerged as one of the nation’s most significant centers for semiconductor research, manufacturing, workforce development, and technology innovation.
The Center of Excellence serves as a focal point for customer engagement, applications development, and technical collaboration. The facility features:
- A climate-controlled metrology laboratory equipped with VIEW Micro Metrology systems
- Dedicated application development and feasibility study resources
- Advanced software training capabilities
- Customer demonstration and evaluation facilities
- Meeting and collaboration space for semiconductor manufacturers, industry partners, and research organizations
Today, the Rochester Center of Excellence reflects the company’s continued commitment to innovation and customer support while positioning VIEW Micro Metrology at the center of the next generation of semiconductor manufacturing growth in North America.
The Next Chapter…
As VIEW celebrates its 50th anniversary, the company reflects on a legacy of innovation that helped shape the field of automated optical metrology. Founded in 1976 by Dr. Richard Alan Hubach, VIEW Engineering pioneered the world’s first machine vision-based dimensional measurement system, establishing the foundation for modern video metrology.
Today, the semiconductor industry stands at the threshold of another transformative era. Advanced packaging technologies, including 2.5D and 3D integration, chiplets, hybrid bonding, high-bandwidth memory (HBM), glass substrates, and heterogeneous integration, are driving unprecedented demands for precision measurement and process control. As critical dimensions shrink and package complexity increases, metrology is becoming more essential than ever to ensure yield, reliability, and performance.
From its Center of Excellence in Rochester, New York, and its regional office in Singapore, VIEW Micro Metrology continues to develop the optical metrology solutions needed to address these emerging challenges. As it enters its sixth decade, the company remains committed to advancing the science of measurement and supporting the next generation of semiconductor and advanced packaging innovations that will power the technologies of tomorrow.
Thank you!
As VIEW celebrates this important milestone, we honor the employees, customers, business partners, and industry pioneers who contributed to our success over the past 50 years. Their commitment to innovation and excellence continues to drive our future as we help shape the next generation of precision metrology solutions.
Here’s to 50 years of innovation—and the next 50 years of advancing measurement technology!