Test Sockets

Semiconductor test sockets are electro-mechanical interfaces that connect packaged chips to automated test equipment (ATE) without permanently soldering the chip. They are crucial for ensuring chips meet performance standards and for high-volume manufacturing before they are integrated into final products. 

Test sockets have customized pin or contact arrays that precisely match the package of the chip being tested.  Because these contacts experience wear and tear over time, the primary goal in test socket metrology is to check for defects to help determine when a socket needs replacement or refurbishment. VIEW systems and customer applications are adept at precisely meeting the design specifications required for reliable contact of the test socket to the chip.